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Download Burn-In Testing: Its Quantification and Optimization eBook

by Feng-Bin Sun,Dimitri Kececioglu

Download Burn-In Testing: Its Quantification and Optimization eBook
ISBN:
0133242110
Author:
Feng-Bin Sun,Dimitri Kececioglu
Category:
Engineering
Language:
English
Publisher:
Prentice Hall; 1 edition (May 20, 1997)
EPUB book:
1955 kb
FB2 book:
1639 kb
DJVU:
1994 kb
Other formats
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Rating:
4.4
Votes:
200


Burn-in Quantification and Optimization Using the Bimodal Mixed-Exponential Distribution.

Burn-in Quantification and Optimization Using the Bimodal Mixed-Exponential Distribution. The Total-Time-on-Test Transform and its Application to Burn-in Time-Determination. Accelerated Burn-in Testing and Burn-in Time Reduction Algorithms. Accelerated Burn-in Using Temperature Cycling. Guidelines for Burn-in Quantification and Optimum Burn-in Time Determination.

Home Dimitri B. Kececioglu Burn-In TestingIts Quantification and Optimization. in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing offers one of the most effective methods of reliability screening at the component level. Burn-In TestingIts Quantification and Optimization. Dimitri B. Kececioglu. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level.

Burn in Testing : Its Quantification and Optimization. 32421-0 When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. by Feng-Bin Sun and Dimitri Kececioglu.

Burn-In Testing: Its Quantification and Optimization (Reliability Engineering), by. .

Burn-In Testing: Its Quantification and Optimization (Reliability Engineering), by Dimitri Kececioglu and Feng-Bin Sun, Published 1997. Effective FMEAs: Achieving Safe, Reliable and Economical Products and Process Using Failure Mode and Effects Analysis), by Carl Carlson, Published 2012. Environmental Stress Screening: Its Quantification, Optimization and Management, by Dimitri Kececioglu and Feng-Bin Sun, Published 1995.

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Burn-in testing has become a frequently used procedure in many industries, especially the semiconductor . oceedings{TI, title {Burn-in Testing: Its Quantification and Applications}, author {Dimitri B. Kececioglu and Xiaofang Chen}, year {2008} }.

Burn-in testing has become a frequently used procedure in many industries, especially the semiconductor industry. In this article, an overview of burn-in testing is presented and its applications are explained. Burn-in methods are related to a variety of failure mechanisms and the conditions under which the tests are run are specified. Kececioglu, Xiaofang Chen. Early life failures are usually attributed to problems in the manufacturing, packaging, and assembling phases.

Environmental Stress Screening: Its Quantification, Optimization and Management, by Dimitri Kececioglu and Feng-Bin Sun, Published 1995.

Dimitri B. Kececioglu The University of Arizona Department of Aerospace & Mechanical Engineering 1130 N. Mountain Avenue Building . Box 210119, Room N517 Tucson, AZ 85721-0119. 8191 E-mail: [email protected] Maintainability, Availability and Operational Readiness Engineering Handbook, by Dimitri Kececioglu, Published 1995.

Burn-In Testing: Its Quantification and Optimization

Burn-In Testing: Its Quantification and Optimization. Burn-In Testing-Its Quantification and Optimization. Kececioglu, P. Department of Aerospace and Mechanical Engineering The University of Arizona. Senior Staff Reliability Engineer. DEStech Publications, Inc.

Burn In Testing book. Start by marking Burn In Testing: Its Quantification And Optimization as Want to Read: Want to Read savin. Read by Dimitri B.

Its Quantification and Optimization. Burn-in testing (an alternative to ESS) is widely used as an aid in producing failure-free electronic components. Dr. Kececioglu, The University of Arizona and Dr. Feng-Bin Sun, Senior Staff Reliability Engineer, Maxtor Corp. ISBN13: 978-1-932078-06-0, 1-932078-06-1, 1st ed. 1997, updated 2002, 698 pages, 6 9, laminated hardcover.

32421-0 When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level. This book covers all aspects of burn-in testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of studies, Burn-In Testing emphasizes mathematical and statistical models for quantifying the failure process, optimizing component reliability, and minimizing the total cost. Vividly illustrated with figures, tables and charts, Burn-In Testing includes: * Definitions, classifications, and test conditions * A review of failure patterns during burn-in * Seven general mathematical models including four bathtub curve models * A quick calculation approach for time determination * Representative cost models and burn-in time optimization * The bimodal mixed-exponential life distribution applied to quantify and optimize burn-in * The Mean Residual Life (MRL) concept applied to quantify and optimize burn-in * The Total Time on Test (TTT) transform and the TTT plot applied to quantify and optimize burn-in * Accelerated testing and its quantification * A roadmap for practical applications With each chapter, Burn-In Testing also offers the appropriate FORTRAN code for the processes described. Burn-In Testing is ideal for practicing engineers in the fields of reliability, life testing, and product assurance. It is also useful for upper division and graduate students in these and related fields.